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US Patent 12027224 Authenticity and yield by reading defective cells

Overview Structured Data Issues Contributors

Is a

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Date Filed

March 16, 2022

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Date of Patent

July 2, 2024

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Patent Application Number

17654998

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Patent Citations

US Patent 9495627 Magnetic tunnel junction based chip identification

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US Patent 9875155 Memory device for performing error correction code operation and redundancy repair operation

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US Patent 10235258 Memory device capable of quickly repairing fail cell

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US Patent 10134487 Semiconductor memory device and memory system including the same

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US Patent 10761997 Methods of memory address verification and memory devices employing the same

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US Patent 7370251 Method and circuit for collecting memory failure information

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US Patent 9123429 Redundancy system for non-volatile memory

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Patent Inventor Names

Julien Frougier

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Ruilong Xie

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Kangguo Cheng

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Patent Jurisdiction

United States Patent and Trademark Office

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Patent Number

0

Patent Primary Examiner

0

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