US Patent 11994968 High level analysis system with report outputting

An analysis system includes a control module generates data gathering parameters and data analysis parameters based on one or more inputs regarding an evaluation of a system aspect under test of a system, a data input module receives system gathered data regarding the system aspect under test to produce gathered data, and a data analysis module configured to generate the evaluation of the system aspect under test based on the data analysis parameters and the gathered data One or more databases store one or more of the gathered data, the data analysis parameters, and the evaluation of the system aspect under test and one or more data extraction modules interact with the system aspect under test to extract data from the system aspect under test in accordance with a respective portion of the data gathering parameters to produce the system gathered data and provide the system gathered data.