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US Patent 11971251 Building inspection and measurement device

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
June 16, 2022
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Date of Patent
April 30, 2024
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Patent Application Number
17841770
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Patent Citations
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US Patent 10619990 Tailor cutting assembly with anti-slip function and tailor ruler therof
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US Patent 11378374 Building inspection and measurement device
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US Patent 6854189 Measuring tool and method of making
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US Patent 6860046 Shelf glide divider gauge and method
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US Patent 6918189 Combination layout tool
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US Patent 6925724 Quilting ruler
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US Patent 6983544 Method of manufacturing optical device and inspection gauge used for the same
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US Patent 7398601 Carpenter's pitch square
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US Patent 7603787 Mail measurement apparatus and method
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US Patent 7743521 Professional layout tool
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•••
Patent Inventor Names
Gregory E. Lowitz
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11971251
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Patent Primary Examiner
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Yaritza Guadalupe-McCall
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