US Patent 11960385 Automatic generation of integrated test procedures using system test procedures

A method for automatic generation of integrated test procedures using system test procedures includes generating a system test case for each system model of a plurality of system models. The method also includes automatically generating an integrated test harness including a group of interacting system models of the plurality of system models. An output signal from one or more of the interacting system models is an input signal to one or more other interacting system models. The method additionally includes automatically generating an integrated test case for each system model in the integrated test harness and automatically running the integrated test case using an integrated test procedure. The method further includes generating an integrated test procedure coverage report in response to running the integrated test case.