The present disclosure uses a capacitive voltage divider to supply a voltage that can be more readily handled by mainstream semiconductor and magnetic components (generally less than 1000 volts). The divided system voltage, expected to be between 500 and 1000 volts, is then converted to a power supply voltage to be used by the measuring equipment. For safety reasons, this voltage is frequently required to be less than approximately 50 volts if it is delivered via a connectorized cable with exposed contacts.