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US Patent 11933683 Strain gauge and strain measurement assembly

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
September 3, 2020
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Date of Patent
March 19, 2024
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Patent Application Number
17011352
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Patent Citations
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US Patent 7723232 Full backside etching for pressure sensing silicon
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US Patent 7633373 Thin film resistor and method of forming the resistor on spaced-apart conductive pads
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US Patent 9890033 Silicon-on-sapphire device with minimal thermal strain preload and enhanced stability at high temperature
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US Patent 6950426 Method and system for transmitting data between two communication devices via a packet-oriented communication network
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US Patent 6952042 Microelectromechanical device with integrated conductive shield
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Patent Inventor Names
David Eric Wagner
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Kim Young-Deok
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James Hoffman
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11933683
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Patent Primary Examiner
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Max H Noori
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CPC Code
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H01L 41/1132
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G01L 1/2293
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