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US Patent 11908817 Bonding structure of dies with dangling bonds

Patent 11908817 was granted and assigned to Taiwan Semiconductor Manufacturing Company on February, 2024 by the United States Patent and Trademark Office.

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Patent
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Patent attributes

Current Assignee
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
119088170
Patent Inventor Names
Hsien-Wei Chen0
Chih-Chia Hu0
Ming-Fa Chen0
Date of Patent
February 20, 2024
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Patent Application Number
171133570
Date Filed
December 7, 2020
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Patent Citations
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US Patent 8847393 Vias between conductive layers to improve reliability
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US Patent 9123615 Vertically integrated image sensor chips and methods for forming the same
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US Patent 9196643 Solid-state imaging device having photoelectric conversion units on a first substrate and a plurality of circuits on a second substrate
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US Patent 9240330 Method of manufacturing a semiconductor integrated circuit device
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US Patent 9299736 Hybrid bonding with uniform pattern density
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...
Patent Primary Examiner
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Bilkis Jahan
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Patent abstract

A method includes polishing a semiconductor substrate of a first die to reveal first through-vias that extend into the semiconductor substrate, forming a dielectric layer on the semiconductor substrate, and forming a plurality of bond pads in the dielectric layer. The plurality of bond pads include active bond pads and dummy bond pads. The active bond pads are electrically coupled to the first through-vias. The first die is bonded to a second die, and both of the active bond pads and the dummy bond pads are bonded to corresponding bond pads in the second die.

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