Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Yuichi Ohshima0
Date of Patent
February 6, 2024
0Patent Application Number
160049160
Date Filed
June 11, 2018
0Patent Citations
Patent Primary Examiner
Patent abstract
A defect detection apparatus includes a defect detection unit and a calculation unit. The defect detection unit detects a defect that appears on an external appearance of a structure through imaging processing from external appearance image data that is generated by imaging the external appearance of the structure with a surveying instrument. The calculation unit calculates defect data relating to the defect detected by the defect detection unit by using coordinate data that is correlated with the external appearance image data.
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