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US Patent 11886329 Automated machine learning test system

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
0
Date Filed
June 15, 2022
0
Date of Patent
January 30, 2024
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Patent Application Number
17840745
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Patent Citations
‌
US Patent 7809988 Test environment having synchronous and asynchronous distributed testing
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‌
US Patent 8276123 Adaptive regression test selection within testing environments
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Patent Inventor Names
David Bruce Elsheimer
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Yan Gao
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Joshua David Griffin
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Gregory Scott Dunbar
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Steven Joseph Gardner
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Connie Stout Dunbar
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11886329
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Patent Primary Examiner
‌
Michael J Huntley
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CPC Code
‌
G06F 11/3688
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G06F 11/3684
0

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