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US Patent 11854448 Methods for measuring electrical properties of electro-optic displays

Patent 11854448 was granted and assigned to E Ink Corporation on December, 2023 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
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Patent attributes

Patent Applicant
E Ink Corporation
E Ink Corporation
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Current Assignee
E Ink Corporation
E Ink Corporation
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
118544480
Patent Inventor Names
Yi Lu0
Teck Ping Sim0
Michael D. McCreary0
Kosta Ladavac0
Karl Raymond Amundson0
Date of Patent
December 26, 2023
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Patent Application Number
181466080
Date Filed
December 27, 2022
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Patent Citations
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US Patent 7002728 Electrophoretic particles, and processes for the production thereof
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US Patent 7012600 Methods for driving bistable electro-optic displays, and apparatus for use therein
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US Patent 7023420 Electronic display with photo-addressing means
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US Patent 7034783 Method for controlling electro-optic display
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US Patent 7061166 Laminated structure and method of manufacturing the same
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US Patent 7061662 Electrophoretic display with thermal control
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US Patent 7072095 Electrophoretic display and novel process for its manufacture
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US Patent 7075502 Full color reflective display with multichromatic sub-pixels
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...
Patent Primary Examiner
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Adam R. Giesy
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CPC Code
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G09G 3/2007
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G09G 3/344
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G09G 2310/06
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G09G 2320/0257
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G01R 27/16
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G09G 3/006
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Patent abstract

A method for driving electro-optic displays including electro-optic material disposed between a common electrode and a backplane. The backplane includes an array of pixel electrodes, each coupled to a transistor. A display controller applies waveforms to the pixel electrodes. The method includes applying first measurement waveforms to a first portion of the pixel electrodes. During each frame of the first measurement waveforms, the same time-dependent voltages are applied to each pixel electrode of the first portion of pixel electrodes. The method includes determining the impedance of the electro-optic material in proximity to the first portion of pixel electrodes based on a measurement of the current flowing through a current measurement circuit and the time-dependent voltages applied to each pixel electrode during the first measurement waveforms, and selecting driving waveforms based on the impedance of the electro-optic material in proximity to the first portion of pixel electrodes.

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