US Patent 11841952 Techniques for detecting exploitation of manufacturing device vulnerabilities

A system and method for determining device attributes using a classifier hierarchy. The method includes: determining at least one exploitation condition for a manufacturing device based on at least one first device attribute of the manufacturing device and a plurality of second device attributes indicated in a vulnerabilities database, wherein the vulnerabilities database further indicates a plurality of known exploits for the plurality of second device attributes; analyzing behavior and configuration of the medical device to detect an exploitable vulnerability for the manufacturing device, wherein the exploitable vulnerability is a behavior or configuration of the manufacturing device which meets the at least one exploitation condition; and performing at least one mitigation action based on the exploitable vulnerability.