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US Patent 11841434 Annotation cross-labeling for autonomous control systems

Patent 11841434 was granted and assigned to Tesla, Inc. on December, 2023 by the United States Patent and Trademark Office.

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Is a
Patent
Patent
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Patent attributes

Patent Applicant
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Tesla, Inc.
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Current Assignee
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Tesla, Inc.
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
118414340
Patent Inventor Names
Anting Shen0
Date of Patent
December 12, 2023
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Patent Application Number
178063580
Date Filed
June 10, 2022
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Patent Citations
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US Patent 8165380 Method, apparatus and program for processing mammographic image
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US Patent 8369633 Video codec method and system
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US Patent 8406515 Method for automatically cropping digital images
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US Patent 8509478 Detection of objects in digital images
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US Patent 8588470 Methods and systems for improved license plate signature matching by similarity learning on synthetic images
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US Patent 8744174 Image processing apparatus, image processing method, and storage medium
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US Patent 8773498 Background compression and resolution enhancement technique for video telephony and video conferencing
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US Patent 8912476 Automatic vehicle exterior light control system assemblies
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Patent Primary Examiner
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Jonathan S Lee
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CPC Code
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G01S 17/89
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G01S 17/894
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G06V 10/757
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G06V 10/809
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G01S 17/86
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B60W 60/001
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B60W 2420/42
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B60W 2420/52
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Patent abstract

An annotation system uses annotations for a first set of sensor measurements from a first sensor to identify annotations for a second set of sensor measurements from a second sensor. The annotation system identifies reference annotations in the first set of sensor measurements that indicates a location of a characteristic object in the two-dimensional space. The annotation system determines a spatial region in the three-dimensional space of the second set of sensor measurements that corresponds to a portion of the scene represented in the annotation of the first set of sensor measurements. The annotation system determines annotations within the spatial region of the second set of sensor measurements that indicates a location of the characteristic object in the three-dimensional space.

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