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US Patent 11823412 Generating and evaluating mappings between spatial point sets with constraints

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Is a
Patent
Patent
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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
118234120
Patent Inventor Names
Tianzhi Yang0
Date of Patent
November 21, 2023
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Patent Application Number
171073480
Date Filed
November 30, 2020
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Patent Citations
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US Patent 8811772 Mapping evaluating for spatial point sets
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US Patent 9020274 Method of interest point matching for images
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US Patent 7010158 Method and apparatus for three-dimensional scene modeling and reconstruction
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US Patent 7373275 System and method of point matching measured positions to template positions
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US Patent 8144947 System and method for finding a picture image in an image collection using localized two-dimensional visual fingerprints
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US Patent 8233722 Method and system for finding a document image in a document collection using localized two-dimensional visual fingerprints
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US Patent 8571351 Evaluating mapping between spatial point sets
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Patent Primary Examiner
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Vu Le
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Patent abstract

A method for generating and evaluating N-to-1 mappings, between spatial point sets in nD, n=2 or 3 implemented on a computing device comprising a programmable general purpose processor and a programmable data-parallel coprocessor and a memory coupled with them. Embodiments comprises using the computing device to receive a first and a second spatial point sets, the first spatial point set comprising a first non-empty portion of non-isolated points and a second non-empty portion of constrained points, an array of fixed correspondents for the second non-empty portion, and a CCISS or padded CCISS between the first non-isolated portion and the second spatial point set, and use these to generate an array of N-to-1 mappings between the first portion of non-isolated points and the second spatial point set, an array of overall distance measures for the array of N-to-1 mappings, and an optimal N-to-1 mapping with the lowest overall distance measure.

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