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US Patent 11802998 Imaging system with optimized extended depth of focus

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Date Filed
November 11, 2021
Date of Patent
October 31, 2023
Patent Application Number
17524462
Patent Citations
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US Patent 7365917 Optical method and system for extended depth of focus
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US Patent 7411743 Multi-wavelength lens, and optical system, optical head and optical disc apparatus using the lens
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US Patent 7569312 Mask data creation method
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US Patent 7572007 Apodized diffractive IOL with frustrated diffractive region
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US Patent 7646549 Imaging system and method for providing extended depth of focus, range extraction and super resolved imaging
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US Patent 7859769 Optical method and system for extended depth of focus
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US Patent 8169716 Optical apparatus with structure for liquid invariant performance
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US Patent 8531783 Imaging method and system for imaging with extended depth of focus
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US Patent 8913331 Imaging method and system with optimized extended depth of focus
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US Patent 9134543 Imaging system with optimized extended depth of focus
•••
Patent Inventor Names
Ofer Limon
Karen Lahav
Alex Zlotnik
Shai Ben-Yaish
Ido Raveh
Zeev Zalevsky
Oren Yehezkel
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11802998
Patent Primary Examiner
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Robert E. Tallman
CPC Code
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G02B 27/4211
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G02B 3/00
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A61F 2/16
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A61F 2/1648
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A61F 2/1613
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B82Y 20/00
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G02C 7/022
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G02C 7/04
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G02C 7/049
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G02C 7/06
•••

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