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US Patent 11779778 Ionizing-radiation beamline monitoring system

Patent 11779778 was granted and assigned to INTEGRATED SENSORS, LLC on October, 2023 by the United States Patent and Trademark Office.

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Patent
Patent

Patent attributes

Patent Applicant
INTEGRATED SENSORS, LLC
INTEGRATED SENSORS, LLC
Current Assignee
INTEGRATED SENSORS, LLC
INTEGRATED SENSORS, LLC
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11779778
Patent Inventor Names
Peter S. Friedman
Date of Patent
October 10, 2023
Patent Application Number
17451517
Date Filed
October 20, 2021
Patent Citations
‌
US Patent 11154728 Ionizing-radiation beamline monitoring system
‌
US Patent 10525285 Ionizing-radiation beam monitoring system
‌
US Patent 10828513 Ionizing-radiation beam monitoring system
Patent Primary Examiner
‌
Hoon K Song
Patent abstract

Embodiments are directed generally to an ionizing-radiation beamline monitoring system that includes a vacuum chamber structure with vacuum compatible flanges through which an incident ionizing-radiation beam enters the monitoring system. Embodiments further include at least one scintillator within the vacuum chamber structure that can be at least partially translated in the ionizing-radiation beam while oriented at an angle greater than 10 degrees to a normal of the incident ionizing-radiation beam, a machine vision camera coupled to a light-tight structure at atmospheric/ambient pressure that is attached to the vacuum chamber structure by a flange attached to a vacuum-tight viewport window with the camera and lens optical axis oriented at an angle of less than 80 degrees with respect to a normal of the scintillator, and at least one ultraviolet (“UV”) illumination source facing the scintillator in the ionizing-radiation beam for monitoring a scintillator stability comprising scintillator radiation damage.

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