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US Patent 11779206 Axial length measurement monitor
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Patent
Date Filed
September 28, 2022
Date of Patent
October 10, 2023
Patent Application Number
17936263
Patent Citations
US Patent 9615736 Optical interference tomographic apparatus, and method for controlling optical interference tomographic apparatus
US Patent 10327631 Post-processing reduction of fixed pattern artifacts and trigger jitter in swept-source optical coherence tomography
US Patent 10413175 Process, arrangements and systems for providing frequency domain imaging of a sample
US Patent 10478058 Speckle reduction in optical coherence tomography images
US Patent 10568501 Apparatus for modelling ocular structures
US Patent 10595723 Measuring method
US Patent 10610096 Miniaturized mobile, low cost optical coherence tomography system for home based ophthalmic applications
US Patent 10912456 Ametropia treatment tracking methods and system
US Patent 10952607 Miniaturized mobile, low cost optical coherence tomography system for home based ophthalmic applications
US Patent 10959613 Scan pattern and signal processing for optical coherence tomography
•••
Patent Inventor Names
Amitava Gupta
Philip M. Buscemi
Stephan Wyder
Matthias Pfister
Ryo Kubota
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
11779206
Patent Primary Examiner
Uzma Alam
CPC Code
A61B 3/102
G01B 9/02027
G01B 9/02028
G01B 9/02091
G01B 2290/45
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