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US Patent 11775878 Automated machine learning test system

Patent 11775878 was granted and assigned to Sas (company) on October, 2023 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
Sas (company)
Sas (company)
Date Filed
November 10, 2021
Date of Patent
October 3, 2023
Patent Applicant
Sas (company)
Sas (company)
Patent Application Number
17523607
Patent Citations
‌
US Patent 8276123 Adaptive regression test selection within testing environments
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US Patent 7644334 Requirements-based test generation
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US Patent 7809988 Test environment having synchronous and asynchronous distributed testing
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US Patent 8136104 Systems and methods for determining compute kernels for an application in a parallel-processing computer system
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US Patent 10346757 Systems and methods for parallelizing Bayesian optimization
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US Patent 10360517 Distributed hyperparameter tuning system for machine learning
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US Patent 10452526 Machine learning for constrained mutation-based fuzz testing
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US Patent 10592398 Generating a test script execution order
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US Patent 10592554 Systems, devices, and methods for parallelized data structure processing
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US Patent 10600005 System for automatic, simultaneous feature selection and hyperparameter tuning for a machine learning model
•••
Patent Inventor Names
Pei-Yi Tan
Yu-Min Lin
Joshua David Griffin
Ricky Dee Tharrington, Jr.
Bengt Wisen Pederson
Raymond Eugene Wright
Yan Gao
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11775878
Patent Primary Examiner
‌
Kamran Afshar
CPC Code
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G06N 7/005
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G06N 20/20

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