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US Patent 11774893 Measurement device and image forming apparatus

Patent 11774893 was granted and assigned to Fujifilm on October, 2023 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent

Patent attributes

Patent Applicant
Fujifilm
Fujifilm
Current Assignee
Fujifilm
Fujifilm
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11774893
Patent Inventor Names
Kouhei Yukawa
Kenta Ogata
Date of Patent
October 3, 2023
Patent Application Number
17458565
Date Filed
August 27, 2021
Patent Citations
‌
US Patent 8875581 Ultrasonic wave control device and recording material determining device
Patent Citations Received
‌
US Patent 12078477 Measurement device and image forming apparatus
0
Patent Primary Examiner
‌
Ryan D Walsh
CPC Code
‌
G03G 2215/00763
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G01N 27/045
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B41J 11/0095
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G03G 2215/00717
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G03G 2215/00616
‌
G03G 15/5029
‌
G03G 2215/00637
‌
G03G 2215/00742
Patent abstract

A measurement device includes: a resistance measurement unit that measures an electrical resistance of a measurement target; a first measurement unit, including a detector that detects information indicating a first physical property other than the electrical resistance of the measurement target, that measures the first physical property from a detection result from the detector; a second measurement unit, including a detector that detects information indicating a second physical property other than the electrical resistance and the first physical property of the measurement target, that measures the second physical property from a detection result from the detector, in which a length of time from a start of driving the detector until a start of actual measurement is longer in the second measurement unit than in the first measurement unit; and a control unit that performs first control causing the first measurement unit to execute a measurement operation of measuring the first physical property in parallel with a measurement operation by the resistance measurement unit, and performs second control causing the second measurement unit to execute a measurement operation of measuring the second physical property in parallel with the measurement operation by the resistance measurement unit and also causing the second measurement unit to start the driving of the detector in the second measurement unit before the start of the driving of the detector in the first measurement unit.

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