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US Patent 11774739 Method for controlling or regulating a microscope illumination

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Contents

Is a
Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11774739
Patent Inventor Names
Thomas Ohrt
Michael Gögler
Date of Patent
October 3, 2023
Patent Application Number
16463017
Date Filed
November 22, 2017
Patent Citations
‌
US Patent 7907271 Method and system for standardizing microscope instruments
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US Patent 8027030 Method and system for standardizing microscope instruments
‌
US Patent 8120768 Method and system for standardizing microscope instruments
‌
US Patent 8427635 Method and system for standardizing microscope instruments
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US Patent 8314931 Method and system for standardizing microscope instruments
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US Patent 8619252 Microscope including a light intensity measuring unit for measuring an intensity of light emitted from the microscope
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US Patent 7199360 System and method for calibrating a fluorescence microscope
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US Patent 7289265 Microscope illumination intensity measuring device
Patent Primary Examiner
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Balram T Parbadia
CPC Code
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G02B 21/0076
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G02B 21/0032
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G02B 21/0064
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G02B 21/008
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G02B 21/16
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G02B 21/365
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G02B 27/283
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G01N 21/6458
...
Patent abstract

A method for regulating a light source of a microscope that illuminates an object, said method including specifying an intended value of an energy parameter of illumination radiation on the object; producing illumination radiation; providing an objective for focusing illumination radiation onto the object; ascertaining a transmission property of the objective for the illumination radiation; output coupling a component of the illumination radiation upstream of the objective as measurement radiation and measuring an actual value of the energy parameter of the measurement radiation; providing a relationship between energy parameters of the measurement radiation and energy parameters of the illumination radiation on the object, and setting the light source in such a way that the actual value of the energy parameter measured for the measurement radiation corresponds to the intended value of the energy parameter according to the relationship.

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