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US Patent 11774498 Multi-rate sampling for hierarchical system analysis

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Is a
Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11774498
Patent Inventor Names
Tong Li
Richard Daniel Kimmel
David Wells Winston
Date of Patent
October 3, 2023
Patent Application Number
17340631
Date Filed
June 7, 2021
Patent Citations
‌
US Patent 9348680 Statistical design with importance sampling reuse
‌
US Patent 9483602 Method and system for identifying rare-event failure rates
‌
US Patent 9753895 Method for process variation analysis of an integrated circuit
‌
US Patent 9805158 Efficient extraction of K-sigma corners from Monte Carlo simulation
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US Patent 9940418 Simulation of hierarchical circuit element arrays
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US Patent 9836564 Efficient extraction of the worst sample in Monte Carlo simulation
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US Patent 11562110 System and method for device mismatch contribution computation for non-continuous circuit outputs
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US Patent 8122404 Performing a statistical timing abstraction for a hierarchical timing analysis of VLSI circuits
...
Patent Primary Examiner
‌
James C. Kerveros
CPC Code
‌
G01R 31/318357
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G06N 20/00
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G01R 31/318314
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G01R 31/31901
Patent abstract

System analysis by receiving a model of a complex system design. The model includes at least one layer. The analysis includes performing a plurality of simulations of the performance of the layer. The number of simulations is determined according to a number of system components associated with the layer. The analysis further includes determining a worst-case result for a set of simulations from the plurality of simulations and assigning the worst-case result to an overall system simulation.

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