US Patent 11774226 Scanning path segmentation of workpiece
Patent 11774226 was granted and assigned to Hexagon Metrology, Inc. on October, 2023 by the United States Patent and Trademark Office.
All edits
US Patent 11774226 Scanning path segmentation of workpiece
A method efficiently measures an object having a feature. The feature has a plurality of cross-sections that each have a surface. The method provides a coordinate measuring machine having a discretely indexable wrist coupled with a measuring probe. The wrist has a given wrist orientation, relative to an arm of the coordinate measuring machine, that is adjustable between a plurality of different orientations. The probe is able to measure different surfaces as a function of the different wrist orientations. The method segments an object to be measured into a plurality of segments that are each measurable with a given wrist orientation.
Find more entities like US Patent 11774226 Scanning path segmentation of workpiece
