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US Patent 11756782 Ion mirror for multi-reflecting mass spectrometers

Overview Structured Data Issues Contributors

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Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

Patent Inventor Names

Mikhail Yavor

Anatoly Verenchikov

Date of Patent

September 12, 2023

Patent Application Number

17586421

Date Filed

January 27, 2022

Patent Citations

US Patent 9865441 Mass spectrometer

US Patent 10163616 Multi-reflecting time-of-flight analyzer

US Patent 10186411 Method and apparatus for mass spectrometry

US Patent 10192723 Soft ionization based on conditioned glow discharge for quantitative analysis

US Patent 10290480 Methods of resolving artifacts in Hadamard-transformed data

US Patent 10373815 Methods of resolving artifacts in Hadamard-transformed data

US Patent 10388503 Method of transmitting ions through an aperture

US Patent 10593525 Mass error correction due to thermal drift in a time of flight mass spectrometer

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Patent Primary Examiner

CPC Code

Improved ion mirrors

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