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US Patent 11755813 Integrated circuit structure

Patent 11755813 was granted and assigned to Taiwan Semiconductor Manufacturing Company on September, 2023 by the United States Patent and Trademark Office.

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Is a
Patent
Patent

Patent attributes

Patent Applicant
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
Current Assignee
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11755813
Patent Inventor Names
Hui-Zhong Zhuang
Shun Li Chen
Lee-Chung Lu
Li-Chun Tien
Ting-Wei Chiang
Date of Patent
September 12, 2023
Patent Application Number
17404594
Date Filed
August 17, 2021
Patent Citations
‌
US Patent 9825024 Semiconductor device
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US Patent 9865544 Semiconductor device layout having a power rail
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US Patent 9984191 Cell layout and structure
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US Patent 10380315 Integrated circuit and method of forming an integrated circuit
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US Patent 10867114 Integrated circuit and method of forming an integrated circuit
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US Patent 7564077 Performance and area scalable cell architecture technology
‌
US Patent 7707521 Layout architecture having high-performance and high-density design
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US Patent 7821039 Layout architecture for improving circuit performance
...
Patent Primary Examiner
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Binh C Tat
CPC Code
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H01L 29/78642
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H01L 22/14
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H01L 2027/11874
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H01L 27/0207
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H01L 23/535
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H01L 2224/48227
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H01L 29/94
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G03F 1/70
...

An IC structure includes a first cell and a first and second rail. The first cell includes a first and second active region and a first, a second and a third gate structure. The first active region having a first dopant type. The second active region having a second dopant type. The first gate structure extending in a second direction, overlapping the first or the second active region. The second gate structure extending in the second direction, and overlapping a first edge of the first or second active region. The third gate structure extending in the second direction, and overlapping at least a second edge of the first or second active region. The first rail extending in the first direction and overlapping a middle portion of the first active region. The second rail extending in the first direction and overlapping a middle portion of the second active region.

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