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US Patent 11754596 Test site configuration in an automated test system

Patent 11754596 was granted and assigned to Teradyne on September, 2023 by the United States Patent and Trademark Office.

Overview Structured Data Issues Contributors

Is a

Patent

Current Assignee

Teradyne

Date Filed

October 22, 2020

Date of Patent

September 12, 2023

Patent Applicant

Teradyne

Patent Application Number

17077804

Patent Citations

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US Patent 7130138 Environmental stress protection scheme for a data storage device

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US Patent 7134553 Packaging for fragile items

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US Patent 7139145 Cluster-based defect detection testing for disk drives

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US Patent 7142419 Life extension in hard disk drives through vibration dampening using pre-stressed polymer springs

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US Patent 7164579 Mounting device for a disk drive unit, releasable fastener and method of testing a disk drive unit

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US Patent 7167360 Hard disk drive housing apparatus and electronic apparatus

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US Patent 7181458 Disk system and method of updating firmware

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US Patent 7203021 Self-heating disk drive

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US Patent 7203060 Disk drive support assembly, clamp assembly and disk drive carrier

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US Patent 7206201 Memory storage device docking adapter having a laterally mounted fan

•••

Patent Citations Received

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US Patent 12007411 Test socket having an automated lid

Patent Inventor Names

Philip Luke Campbell

Michael O. McKenna

Christopher James Bruno

John Patrick Toscano

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

11754596

Patent Primary Examiner

CPC Code

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