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US Patent 11747604 Method and device for scanning a sample

Patent 11747604 was granted and assigned to Leica Microsystems on September, 2023 by the United States Patent and Trademark Office.

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Is a
Patent
Patent

Patent attributes

Patent Applicant
Leica Microsystems
Leica Microsystems
Current Assignee
Leica Microsystems
Leica Microsystems
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11747604
Patent Inventor Names
Holger Birk
Lars Friedrich
Date of Patent
September 5, 2023
Patent Application Number
16760486
Date Filed
November 5, 2018
Patent Citations
‌
US Patent 7724426 Laser scanning microscope and microscopic observing method
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US Patent 7339148 Confocal microscope
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US Patent 8054542 Scanning laser microscope
Patent Primary Examiner
‌
Thong Q Nguyen
CPC Code
‌
G02B 21/0036
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G02B 21/0048
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G02B 21/06
‌
G02B 21/0032
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G02B 21/0024
‌
G02B 21/002
‌
G02B 21/00

A method for scanning a sample includes generating at least two illumination points in order to form a point pattern, wherein the point pattern has a settable number of illumination points. At least one freely selectable parameter for defining the point pattern is preset or is set. At least one predefined region of the sample is scanned by moving the point pattern defined by the freely selectable parameter along a first direction such that scan lines assigned to the illumination points of the point pattern are generated, and along a second direction such that further scan lines are generated in each case following the scan lines. The movement of the point pattern in the second direction is carried out in scan steps of identical size or at a constant speed. The illumination points of the point pattern are arranged on a line along the second direction.

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