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US Patent 11712837 Optical scanning for industrial metrology

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Is a
Patent
Patent
1

Patent attributes

Patent Applicant
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Inkbit
1
Current Assignee
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Inkbit
1
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
117128371
Date of Patent
August 1, 2023
1
Patent Application Number
173074871
Date Filed
May 4, 2021
1
Patent Citations
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US Patent 10011071 Additive manufacturing using density feedback control
1
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US Patent 10252466 Systems and methods of machine vision assisted additive fabrication
1
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US Patent 10456984 Adaptive material deposition for additive manufacturing
1
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US Patent 10725446 Method and device for calibrating multiple energy rays for the additive manufacturing of an object
1
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US Patent 10994490 Calibration for additive manufacturing by compensating for geometric misalignments and distortions between components of a 3D printer
1
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US Patent 10926473 Multi-material scanning for additive fabrication
1
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US Patent 8237788 Methods of automatic geometric calibration using laser scanning reflectometry
1
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US Patent 9259931 System and method for print head alignment using alignment adapter
1
...
Patent Primary Examiner
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Galen H Hauth
1
CPC Code
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B33Y 10/00
1
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B29C 64/135
1
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B29C 64/205
1

A method for additive manufacturing includes forming an object including depositing a first material including a first coloring component and a second material including a second coloring component, wherein both the first material and the second material further include a corresponding fluorescent component, scanning the object, including causing an emission of an optical signal from the object, wherein the emission of the optical signal is caused at least in part by an emission from the fluorescent components interacting with the first coloring component and the second coloring component as it passes from the fluorescent components to the surface of the object, sensing the emission of the optical signal, and determining presence of the first material and the second material based at least in part on the sensed emission of the optical signal.

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