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US Patent 11711178 Measurement apparatus and measurement method

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Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

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Patent Number

Date of Patent

July 25, 2023

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Patent Application Number

176699540

Date Filed

February 11, 2022

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Patent Citations

US Patent 10965414 Signal configuration method, device and storage medium

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US Patent 11343057 Transmission of phase tracking reference signals (PT-RS) for bandwidth parts

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US Patent 11362781 Reference signal configuration method, apparatus, and system

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US Patent 11375462 Method and apparatus for phase tracking reference signal in a wireless communication system

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US Patent 7397758 Channel tracking in a OFDM wireless receiver

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US Patent 7397871 Estimation of single-to-noise ratio by processing measured error vector magnitude

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US Patent 7411935 Selecting the data rate of a wireless network link according to a measure of error vector magnitude

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US Patent 7460512 Selecting an access point according to a measure of received signal quality

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Patent Primary Examiner

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An EVM measurement value is appropriately determined while CPE/ICI correction is taken into account. In a measurement apparatus (

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