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US Patent 11709132 Modulus-enforced probe

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Is a
Patent
Patent
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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
117091320
Date of Patent
July 25, 2023
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Patent Application Number
163029110
Date Filed
May 18, 2017
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Patent Citations
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US Patent 10921229 Detection scheme for particle size and concentration measurement
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Patent Citations Received
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US Patent 12085520 Quantum-limited extreme ultraviolet coherent diffraction imaging
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Patent Primary Examiner
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Hina F Ayub
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CPC Code
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G01N 2021/4711
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G01N 21/33
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G01N 21/45
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G01N 2021/1782
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G01N 21/4795
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G01N 21/956
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G01N 2201/061
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G01N 21/4788
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Apparatus and methods for forming an image of an object which involves focusing partially to fully spatially-coherent radiation onto a sample and collecting the resulting scattered radiation (the “standard data set”) on an array detector. In addition to the standard dataset, an additional measurement or plurality of measurements is made of a relatively-unscattered beam, using the array detector, which comprises the “modulus enforced probe (MEP) dataset”. This MEP dataset serves as an extra constraint, called the MEP constraint, in the phase retrieval algorithm used to reconstruct the image of the object.

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