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US Patent 11674904 Systems and methods for additive manufacturing operations

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 US Patent 11674904 Systems and methods for additive manufacturing operations

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This disclosure describes various system and methods for monitoring photons emitted by a heat source of an additive manufacturing device. Sensor data recorded while monitoring the photons can be used to predict metallurgical, mechanical and geometrical properties of a part produced during an additive manufacturing operation. In some embodiments, a test pattern can be used to calibrate an additive manufacturing device.

Infobox
Is a
Patent
Patent
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
116749040
Date of Patent
June 13, 2023
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Patent Application Number
169158580
Date Filed
June 29, 2020
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Patent Citations
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US Patent 7127304 System and method to predict the state of a process controller in a semiconductor manufacturing facility
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US Patent 8420001 Influencing specific mechanical properties of three-dimensional objects manufactured by a selective sintering by means of electromagnetic radiation from a powder comprising at least one polymer or copolymer
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US Patent 8784721 Method of manufacturing three-dimensional objects by laser sintering
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US Patent 8803073 Method and device for calibrating an irradiation device
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US Patent 9108358 System for real time monitoring for defects in an object during three-dimensional printing using a terahertz sensor
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US Patent 9271110 Location awareness session management and cross application session management
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US Patent 9925715 Systems and methods for monitoring a melt pool using a dedicated scanning device
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US Patent 9999924 Method and system for monitoring additive manufacturing processes
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Patent Primary Examiner
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Adam Lee
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