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US Patent 11585910 Non-uniformity correction of photodetector arrays

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Is a
Patent
Patent

Patent attributes

Patent Applicant
Allegro Microsystems, Llc
Allegro Microsystems, Llc
Current Assignee
Allegro Microsystems, Llc
Allegro Microsystems, Llc
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11585910
Date of Patent
February 21, 2023
Patent Application Number
17402065
Date Filed
August 13, 2021
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...
Patent Primary Examiner
‌
Que Tan Le
CPC Code
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G01S 17/00
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G01S 17/42
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G01S 17/04
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G01S 17/06
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G01S 17/88
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H01L 31/02
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H01L 31/00

Methods and apparatus for nonuniformity correction (NUC) for a sensor having an avalanche photodiode (APD) array and an integrated circuit. The sensor can include anode bias control module, a passive mode module, and an active mode module. DC photocurrent from the APD array can be measured and used for controlling an anode reverse bias voltage to each element in the APD to achieve a nonuniformity correction level less than a selected threshold.

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