US Patent 11585871 Rapid carrier-resolved photo-hall analysis
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Patent Jurisdiction
Patent Number
115858710
Date of Patent
February 21, 2023
0Patent Application Number
176439850
Date Filed
December 13, 2021
0Patent Citations
Patent Primary Examiner
CPC Code
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US Patent 11585871 Rapid carrier-resolved photo-hall analysis
Article
A system for and methods of semiconductor testing and characterization are disclosed. The system includes a parallel dipole line (PDL) system for applying a magnetic field to a sample in a measurement chamber and electrical equipment for testing the sample. The testing includes applying a first light exposure to the sample with the PDL system set to zero magnetic field and monitoring longitudinal resistance (R
Infobox
Is a
Patent Jurisdiction
Patent Number
115858710
Date of Patent
February 21, 2023
0Patent Application Number
176439850
Date Filed
December 13, 2021
0Patent Citations
Patent Primary Examiner
CPC Code
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