US Patent 11580401 Distance metrics and clustering in recurrent neural networks

Distance metrics and clustering in recurrent neural networks. For example, a method includes determining whether topological patterns of activity in a collection of topological patterns occur in a recurrent artificial neural network in response to input of first data into the recurrent artificial neural network, and determining a distance between the first data and either second data or a reference based on the topological patterns of activity that are determined to occur in response to the input of the first data.