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US Patent 11567103 Testing device
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Is a
Patent
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Date Filed
July 19, 2021
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Date of Patent
January 31, 2023
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Patent Application Number
17379103
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Patent Citations
US Patent 10794933 Integrated circuit contact test apparatus with and method of construction
Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
11567103
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Patent Primary Examiner
Paresh Patel
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CPC Code
G01R 1/06716
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G01R 1/07307
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