US Patent 11513190 Methods and apparatus to test radar integrated circuits
Patent 11513190 was granted and assigned to Texas Instruments on November, 2022 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
May 31, 2019
0
Date of Patent
November 29, 2022
0
Patent Applicant
Patent Application Number
16428576
0
Patent Inventor Names
Karthik Subburaj
0
Zahir Ibrahim Parkar
0
Vashishth Dudhia
0
Krishnanshu Dandu
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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