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US Patent 11501420 Reconstructing phase images with deep learning

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
1
Date Filed
September 22, 2020
1
Date of Patent
November 15, 2022
1
Patent Application Number
17028448
1
Patent Citations
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US Patent 10176565 Method and system for imaging a cell sample
1
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US Patent 11209737 Performance optimized scanning sequence for eBeam metrology and inspection
Patent Citations Received
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US Patent 11670480 System and method for generating and analyzing roughness measurements
3
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US Patent 11996265 System and method for generating and analyzing roughness measurements and their use for process monitoring and control
4
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US Patent 11664188 Edge detection system
5
Patent Inventor Names
Abdulrahman Alhaimi
1
Kaupo Palo
1
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
11501420
1
Patent Primary Examiner
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Lewis G West
1
CPC Code
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G06T 11/00
1
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G01N 33/4833
1
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G06N 3/08
1
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G06N 20/00
1
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G06N 3/0454
1
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G06T 2207/30072
1
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G06T 2207/20081
1
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G06T 2207/10056
1
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G06T 5/002
1
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G06T 5/50
1
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