US Patent 11481993 Trained machine learning model for estimating structure feature measurements

A computer system trains a machine learning model to estimate a real-world measurement of a feature of a structure. The machine learning model is trained using a plurality of digital image sets, wherein each image set depicts a particular structure, and a plurality of measurements, wherein each measurement is a measurement of a feature of a particular structure. After the machine learning model is trained, it is used to estimate a measurement of a feature of a particular structure depicted in a particular image set.