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US Patent 11480518 Asymmetric interferometric optical photothermal infrared spectroscopy

Patent 11480518 was granted and assigned to Photothermal Spectroscopy Corp on October, 2022 by the United States Patent and Trademark Office.

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Patent Citations Received
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US Patent 12066328 Photothermal infrared spectroscopy utilizing spatial light manipulation
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Patent Inventor Names
Craig Prater0
David Grigg0
Derek Decker0
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Patent Citations Received
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US Patent 11774354 Interferometric optical photothermal infrared spectroscopy
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 US Patent 11480518 Asymmetric interferometric optical photothermal infrared spectroscopy

Article

Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.

Infobox
Is a
Patent
Patent
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Patent Applicant
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Photothermal Spectroscopy Corp
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Current Assignee
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Photothermal Spectroscopy Corp
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
114805180
Date of Patent
October 25, 2022
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Patent Application Number
167020940
Date Filed
December 3, 2019
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Patent Citations
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US Patent 10228388 Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy
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US Patent 10228389 Method and apparatus for infrared scattering scanning near-field optical microscopy with background suppression
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US Patent 10241131 Method and apparatus for chemical and optical imaging with a broadband source
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US Patent 10473693 Method and apparatus for infrared scanning near-field optical microscopy based on photothermal effect
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US Patent 10677722 Photothermal imaging device and system
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US Patent 10696405 Airliner passenger suite seating arrangements with shared aisle suite access
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US Patent 10845248 Systems and methods for bond-selective transient phase imaging
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US Patent 10942116 Method and apparatus for enhanced photo-thermal imaging and spectroscopy
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US Patent 10969405 Method and apparatus for sub-diffraction infrared imaging and spectroscopy and complementary techniques
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Patent Primary Examiner
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Abdullahi Nur
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CPC Code
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G02B 21/002
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G01J 3/45
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G01N 21/35
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G01N 21/171
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