US Patent 11474059 Thermographic non-destructive testing using temperature-limited modulation

A method for performing non-destructive testing using active thermography includes applying, using at least one thermal excitation device, a first excitation pulse to a workpiece; capturing, using an imaging device, a first iso-time frame of the workpiece; and determining a second excitation pulse by modifying one or more of a duration D of the first excitation pulse, an amplitude A of the first excitation pulse, or a spacing W between the first excitation pulse and the second excitation pulse. The method also includes applying, using the at least one of the thermal excitation device, the second excitation pulse to the workpiece; capturing, using the imaging device, a second iso-time frame of the workpiece; and determining a numerical fit of the first iso-time frame and the second iso-time frame.