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US Patent 11385104 On-chip polarization detection and polarimetric imaging

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
0
Date Filed
December 21, 2018
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Date of Patent
July 12, 2022
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Patent Application Number
16956988
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Patent Citations Received
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US Patent 11978752 Aperture-metasurface and hybrid refractive-metasurface imaging systems
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US Patent 11927769 Polarization sorting metasurface microlens array device
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US Patent 11537025 Molding free-space light with guided-wave-driven metasurfaces
Patent Inventor Names
Xiahui Chen
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Jing Bai
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Yu Yao
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Chu Wang
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Chao Wang
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Ali Basiri
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11385104
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Patent Primary Examiner
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Roy M Punnoose
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CPC Code
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G02B 27/286
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G02B 5/3083
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G02B 1/002
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G01J 4/04
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B82Y 20/00
0
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G01J 4/00
0
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G02B 5/3058
0
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G02B 5/3025
0

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