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US Patent 11385104 On-chip polarization detection and polarimetric imaging

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Contents

Is a
Patent
Patent
0

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
113851040
Patent Inventor Names
Xiahui Chen0
Jing Bai0
Yu Yao0
Chu Wang0
Chao Wang0
Ali Basiri0
Date of Patent
July 12, 2022
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Patent Application Number
169569880
Date Filed
December 21, 2018
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Patent Citations Received
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US Patent 11978752 Aperture-metasurface and hybrid refractive-metasurface imaging systems
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US Patent 11927769 Polarization sorting metasurface microlens array device
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US Patent 11537025 Molding free-space light with guided-wave-driven metasurfaces
Patent Primary Examiner
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Roy M Punnoose
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CPC Code
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G02B 27/286
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G02B 5/3083
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G02B 1/002
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G01J 4/04
0
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B82Y 20/00
0
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G01J 4/00
0
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G02B 5/3058
0
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G02B 5/3025
0

A polarization sensor is described. It includes a quarter-wave plate to convert circularly polarized light into linearly polarized light. The quarter-wave plate is realized as a metasurface. The sensor also includes a linear polarizer to analyze the light generated by the quarter-wave plate, and a photodetector to receive the analyzed light. The sensor may be combined with other linear polarization sensors to form a sensor capable of complete measurement of the polarization state of incident light. An array of these sensors can be integrated directly onto image sensors to form a polarimetric imager.

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