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US Patent 11354215 Computing device and method for analyzing device

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Is a
Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11354215
Date of Patent
June 7, 2022
Patent Application Number
16508393
Date Filed
July 11, 2019
Patent Citations
‌
US Patent 10303574 Self-generated thermal stress evaluation
Patent Primary Examiner
‌
Lechi Truong
CPC Code
‌
G06F 9/54
‌
G06F 9/445

A method for analyzing how a baseboard management controller (BMC) is monitoring a device in an analysis system platform performs an analysis of features of the device being monitored by the BMC. The method receives an IP address of a BMC input by a user, obtains source code corresponding to the IP address and determines application programming interface type corresponding to the source code. A function menu according to the application programming interface type is selected, the function menu comprising at least one item for analysis. The feature performance of the device being monitored is analyzed and recorded and results of the performance analysis are stored.

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