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US Patent 11346769 Fast generalized multi-wavelength ellipsometer
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Current Assignee
ONTO INNOVATION INC.
Date Filed
February 20, 2020
Date of Patent
May 31, 2022
Patent Applicant
ONTO INNOVATION INC.
Patent Application Number
16796648
Patent Citations
US Patent 10955331 Imaging or measurement methods and systems
US Patent 10921255 Optical measuring device and process
US Patent 11067450 Measurement apparatus of wavefront and polarization profile of vectorial optical fields
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
11346769
Patent Primary Examiner
Roy M Punnoose
CPC Code
G01N 21/211
G01J 4/04
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