US Patent 11342175 Multi-reflecting time of flight mass analyser

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Patent

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Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

113421750

Patent Inventor Names

Jeffery Mark Brown0

Boris Kozlov0

Date of Patent

May 24, 2022

Patent Application Number

170543510

Date Filed

May 3, 2019

Patent Citations

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US Patent 10141175 Quasi-planar multi-reflecting time-of-flight mass spectrometer

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US Patent 10141176 Multi-reflection mass spectrometer with deceleration stage

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US Patent 10163616 Multi-reflecting time-of-flight analyzer

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US Patent 10186411 Method and apparatus for mass spectrometry

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US Patent 10192723 Soft ionization based on conditioned glow discharge for quantitative analysis

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US Patent 10290480 Methods of resolving artifacts in Hadamard-transformed data

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US Patent 10373815 Methods of resolving artifacts in Hadamard-transformed data

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US Patent 10388503 Method of transmitting ions through an aperture

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Patent Primary Examiner

CPC Code

A mass spectrometer comprising: a multi-reflecting time of flight (MRTOF) mass analyser or mass separator having two gridless ion mirrors

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US Patent 11342175 Multi-reflecting time of flight mass analyser

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