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US Patent 11310467 Object inspection system and method for inspecting an object

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Is a
Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11310467
Date of Patent
April 19, 2022
Patent Application Number
16866110
Date Filed
May 4, 2020
Patent Citations
‌
US Patent 10063758 Vehicle photographic tunnel
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US Patent 10082470 Defect marking for semiconductor wafer inspection
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US Patent 10176588 System and method for specular surface inspection
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US Patent 10261028 Device for optically inspecting a surface of a sample
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US Patent 10281029 Sensor device for sensing a selector lever position and selector lever device for a motor vehicle
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US Patent 10401303 Lighting apparatus for conveyors
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US Patent 10462444 Three-dimensional inspection
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US Patent 10482347 Inspection of the contoured surface of the undercarriage of a motor vehicle
...
Patent Citations Received
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US Patent 12085473 Deflectometry devices, systems and methods
0
Patent Primary Examiner
‌
Hung Q Dang

An object inspection system and a method for detecting defects which utilizes a plurality of cameras and lights to capture images of a portion of an object and which uses the captured images to determine the presence of a defect upon a surface, such as surface, of the object and which may communicated the location of the identified defect to an automated defect repair assembly.

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