Log in
Enquire now
‌

US Patent 11255898 System and method for testing a device-under-test

Patent 11255898 was granted and assigned to Rohde & Schwarz GmbH & Co. KG on February, 2022 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
1
Current Assignee
‌
Rohde & Schwarz GmbH & Co. KG
1
Date Filed
May 8, 2020
1
Date of Patent
February 22, 2022
1
Patent Applicant
‌
Rohde & Schwarz GmbH & Co. KG
1
Patent Application Number
16870374
1
Patent Citations
‌
US Patent 10126377 Magneto-optical defect center magnetometer
‌
US Patent 10228429 Apparatus and method for resonance magneto-optical defect center material pulsed mode referencing
Patent Inventor Names
Thomas Winkler
1
Ryanne Leong
1
Thomas Ruster
1
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
11255898
1
Patent Primary Examiner
‌
Vinh P Nguyen
1

Find more entities like US Patent 11255898 System and method for testing a device-under-test

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Golden Query Tool
Golden logo

Company

  • Home
  • Press & Media
  • Blog
  • Careers
  • WE'RE HIRING

Products

  • Knowledge Graph
  • Query Tool
  • Data Requests
  • Knowledge Storage
  • API
  • Pricing
  • Enterprise
  • ChatGPT Plugin

Legal

  • Terms of Service
  • Enterprise Terms of Service
  • Privacy Policy

Help

  • Help center
  • API Documentation
  • Contact Us
By using this site, you agree to our Terms of Service.