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US Patent 11194004 Diagnostic circuits and methods for sensor test circuits

Patent 11194004 was granted and assigned to Allegro Microsystems, Llc on December, 2021 by the United States Patent and Trademark Office.

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Patent abstractTimelineTable: Further ResourcesReferences
Is a
Patent
Patent
1

Patent attributes

Patent Applicant
Allegro Microsystems, Llc
Allegro Microsystems, Llc
1
Current Assignee
Allegro Microsystems, Llc
Allegro Microsystems, Llc
1
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
111940041
Patent Inventor Names
Devon Fernandez1
P. Karl Scheller1
Date of Patent
December 7, 2021
1
Patent Application Number
167885051
Date Filed
February 12, 2020
1
Patent Citations Received
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US Patent 11561257 Signal path monitor
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US Patent 12104900 Sensor with estimated real-time parameter data
4
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US Patent 12107710 Sensor signaling of absolute and incremental data
5
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US Patent 11525705 Magnetic-field sensor with test pin for diagnostic assessment of target validity, target placement and/or control of signal range and/or offset
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US Patent 11598655 Magnetic-field sensor with test pin for control of signal range and/or offset
8
Patent Primary Examiner
‌
Alvaro E Fortich
1
Patent abstract

A sensor includes a detector configured to sense a parameter, at least one test circuit configured to detect a respective fault condition of the sensor and generate a fault signal in response to detecting the fault condition, a checker configured to test the at least one test circuit to determine the operational status of the at least one test circuit, and an output signal generator, coupled to receive the sensed parameter, the fault signal, and the operational status of the at least one test circuit. The output signal generator is configured to generate an output signal of the sensor to communicate the sensed parameter and the operational status of the at least one test circuit.

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