US Patent 11181423 Birefringent interferometer for measuring photoluminescence properties of samples

A measurement system of photoluminescence properties of a sample, comprises a radiation source module configured to generate a first radiation, an excitation optical path coupled to the radiation source module, a support structured to support a sample to be optically coupled to excitation optical path and adapted to provide a photoluminescence radiation, and collection path coupled to the sample and configured to propagate the photoluminescence radiation. The system also includes an analysis device configured to receive the photoluminescence radiation and provide data/information on photoluminescence properties of sample. At least one path between the excitation path and the collection path comprises a respective adjustable birefringent common-path interferometer module configured to produce first and second radiations adapted to interfere with each other.