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US Patent 11094120 Inspection processing system, inspection processing method, and inspection processing program

Patent 11094120 was granted and assigned to Obayashi Corporation on August, 2021 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Patent Applicant
Obayashi Corporation
Obayashi Corporation
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Current Assignee
Obayashi Corporation
Obayashi Corporation
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
110941200
Patent Inventor Names
Kazuyuki Goto0
Hidefumi Takenaka0
Tamaki Horii0
Yuichi Ikeda0
Takayuki Yamamoto0
Date of Patent
August 17, 2021
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Patent Application Number
201807250
Date Filed
July 25, 2018
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Patent Citations Received
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US Patent 11523013 Damage diagram creation method, damage diagram creation device, damage diagram creation system, and recording medium
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US Patent 11948291 Damage diagram creation method, damage diagram creation device, damage diagram creation system, and recording medium
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Patent abstract

An inspection processing system includes a control unit connected to a photographing unit and an output unit. The control unit includes circuitry. The inspection processing system identifies a current position, displays a virtual image of a three-dimensional model of a structure corresponding to the current position. The virtual image is superimposed on a structure image obtained from the photographing unit. The inspection processing system further obtains an evaluation result of an evaluation item of an inspection subject using the structure image on which the displayed virtual image is superimposed, and records the evaluation result in an inspection information memory in association with the position of the inspection subject in the three-dimensional model.

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