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US Patent 11035802 Surface defect detection system and method thereof

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Patent
Patent
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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
110358020
Patent Inventor Names
Shih-Sung Lin0
Trista Pei-Chun Chen0
Wei-Chao Chen0
Date of Patent
June 15, 2021
0
Patent Application Number
164100030
Date Filed
May 13, 2019
0
Patent Citations Received
‌
US Patent 12079982 Object defect detection
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Patent Primary Examiner
‌
Siamak Harandi
0
Patent abstract

A surface defect detection method applied to a surface of an object is disclosed. The method includes obtaining an image of the surface, performing a deep learning algorithm by a computing device to set a plurality of bounding boxes in the image and to output a plurality of feature parameter sets associated with the plurality of bounding boxes, with each bounding box enclosing a possible defect of the surface, and performing a classifying algorithm by the computing device according to the bounding boxes and the feature parameters to determine whether the surface conforms to a specification.

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