US Patent 11030738 Image defect identification

A method, a device and a computer program product for image processing are proposed. In the method, whether a first image indicates a defect associated with a target object is determined. In response to determining that the first image indicates the defect, a second image absent from the defect is obtained based on the first image. The defect is identified by comparing the first image with the second image. In this way, the defect associated with the target object in the image can be accurately and efficiently identified or segmented.